Equipments - Characterization

Environmental scanning electron microscope
Optical tomography
Atomic force microscope (AFM)
Fluorescence optical microscopy
X-ray tomography (access to ESRF lines)

---

Size measurement by laser diffraction
Dynamic light scattering (DLS)
Electrophoretic mobility
Flow potential

---

Differential scanning calorimetry (DSC)
Dynamic mechanical analyzer (DMA)
Contact angle
Tensiometer
Surface conductivity
Use properties of materials

---

Rheometers